Electron waves recorded in the transmission electron microscope. The image was formed by recording a highly defocused bright-field image of an electrically biased tungsten needle. The details of the interference pattern, which result from the propagation of an electron wave function that is modulated in phase by the biased metal needle, can be compared with computer simulations to determine the magnitude and direction of the electric field close to the tip of the needle. Acknowledgments: Giulio Pozzi, Marco Beleggia, Takeshi Kasama, Tom Kelly, Rafal Dunin-Borkowski.